SEM and XRD Laboratories

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The Departmental of Earth Sciences operates a JEOL 6610LV Scanning Electron Microscope and a Philips X-ray Diffraction system.

These instruments are available for use by members of this and other universities, as well as for commercial applications.


JEOL 6610LV Scanning Electron Microscope (SEM)

Equipped with:

Oxford Energy Dispersive Spectrometer (EDS)

GATAN mini Cathodoluminescence (CL)

Backscattered Electron Detector (BSE)

Secondary Electron Detector (SE)

Infrared Camera

External Faraday Cup

Low vacuum mode

Resolution depends on conditions, sample type and sample prep, some examples can be found here in Gallery.


Phllips PW3710 Powder X-ray Diffractometer (XRD)

Equipped with:

Cu – Ceramic X-ray tube

Ni Filter

Gas Proportional Detector

Theta – 2 Theta Goniometer Configuration